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Compatibility and Testing of Electronic Components

Compatibility and Testing of Electronic Components

C. E. Jowett (Auth.)
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种类:
Engineering
年:
1972
出版社:
Newnes-Butterworth
语言:
english
页:
351
ISBN 10:
0408703539
ISBN 13:
9780408703536
文件:
PDF, 13.44 MB
IPFS:
CID , CID Blake2b
english, 1972
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关键词

 
temperature
resistance
substrate
components
testing
circuit
capacitors
figure
dielectric
circuits
compatibility
materials
surface
thermal
resistor
chip
electrical
failure
device
voltage
tests
resistors
capacitor
integrated
silicon
ceramic
stress
oxide
thick
devices
current
bonding
layer
capacitance
method
hybrid
aluminium
thickness
conductor
mechanical
temperatures
solder
tantalum
films
required
silver
techniques
substrates
defects
insulation
package
diffusion
failures
range
component
reliability
systems
conductors
leads
values