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PHYSICS AND TECHNOLOGY OF CRYSTALLINE OXIDE SEMICONDUCTOR CAAC-IGZO APPLICATION TO LSI

SHUNPEI YAMAZAKAI
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年:
2017
出版社:
WILEY
语言:
chinese
页:
351
ISBN:
40889249
文件:
PDF, 48.45 MB
IPFS:
CID , CID Blake2b
chinese, 2017
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关键词

 
igzo
caac
figure
current
gate
fets
semiconductor
physics
oxide
layer
technology
memory
device
voltage
crystalline
circuit
method
measurement
leakage
shown
drain
measured
extremely
width
retention
shows
laboratory
subthreshold
crystal
insulator
nosram
sensor
bias
injection
devices
levels
electrons
diagram
mobility
electrode
yamazaki
electron
limit
lsis
adapted
calculated
detection
effect
active
effective
obtained
operation
equation
introduction
mass
thickness
configuration
fpga
substrate
circuits